All existing Wavefront sensors (WFS) can only measure several wavefronts by sequential image acquisition. Sequential multi-spectral WFS has several drawbacks: it is difficult to implement, expensive, and incompatible with single-pulse laser characterization. This innovative system now allows simultaneous wavefront shapes measurement at different wavelengths using the multi-spectral (broadband or multi-line) light beam. It relies on the recent development of a wavefront analyzer (DiPSI) based on the use of a simple diffuser that obviates all these drawbacks by performing spectral measurements simultaneously. This aspect is advantageous for a variety of applications such as optical metrology, laser metrology, quantitative phase imaging and ophthalmology.
Applications :
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